Voltage required to detach an adhered particle by Coulomb interaction for micromanipulation

Journal of Applied Physics

Volumn 90, Issue 1, 2001, Pages 432-437

  Takahashi, Kunio ^a   Kajihara, Hideaki ^a   Urago, Masataka ^a   Saito, Shigeki ^a   Mochimaru, Yoshihiro ^a   Onzawa, Tadao ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035397181     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1379353     Document Type: Article

References (19)

1. K. L. Johnson, K. Kendall, and A. D. Roberts, Proc. R. Soc. London, Ser. A 324, 301 (1971); a simplified version is given in K. L. Johnson, Contact Mechanics (Cambridge University Press, London, 1985), p. 127.
2. K. L. Johnson, K. Kendall, and A. D. Roberts, Proc. R. Soc. London, Ser. A 324, 301 (1971); a simplified version is given in K. L. Johnson, Contact Mechanics (Cambridge University Press, London, 1985), p. 127.
3. F. Arai, D. Andou, and T. Fukuda, in Proceedings of the IEEE Electro Mechanical Systems (MEMS) (IEEE, New York, 1996), p. 354.
4. F. Arai and T. Fukuda, in Proceedings of the IEEE International Conference on Robotics & Automation (IEEE, New York, 1997), p. 1472.
5. M. Egashira, T. Konno, and N. Shinya, J. Intell. Mater. Syst. Struct. 7, 267 (1996).
6. T. Tanikawa, Y. Hashimoto, and T. Arai, in Proceedings of the IEEE International Conference on Intelligent Robots & Systems (IEEE, New York, 1998), p. 776.
7. K. F. Bohringer, K. Goldberg, M. Cohn, R. Howe, and A. Pisano, in Proceedings of the IEEE International Conference on Robotics & Automation (IEEE, New York, 1998), p. 1204.
8. H. T. Miyazaki, Y. Tomizawa, S. Saito, T. Sato, and N. Shinya, J. Appl. Phys. 88, 3330 (2000).
9. Y. Rollot, S. Regnier, and J. C. Guinot, Int. J. Adhes, Adhesives 19, 35 (1999).
10. S. Saito, H. T. Miyazaki, and T. Sato, in Proceedings of the IEEE International Conference on Robotics & Automation (IEEE, New York, 1999), p. 2736.
11. W. Zesch, M. Brunner, and A. Weber, in Proceedings of the IEEE International Conference on Robotics & Automation (IEEE, New York, 1997), p. 1461.
12. H. T. Miyazaki, Y. Tomizawa, K. Koyano, T. Sato, and N. Shinya, Rev. Sci. Instrum. 71, 3123 (2000).
13. D. A. Hays, Inst. Phys. Conf. Ser. 118, 223 (1991).
14. J. Q. Feng, E. A. Eklund, and D. A. Hays, J. Electrost. 40&41, 289 (1997).
15. H. Mizes, M. Ott, E. Eklund, and D. Hays, Colloids Surf., A 165, 11 (2000).
16. K. Takahashi, R. Mizuno, and T. Onzawa, J. Adhes. Sci. Technol. 9, 1451 (1995).
17. K. Takahashi and T. Onzawa, J. Adhes. Sci. Technol. 10, 17 (1996).
18. K. Takahashi and T. Onzawa, Phys. Rev. B 48, 5689 (1993).
19. K. Takahashi, T. Liyama, N. Katoh, and T. Onzawa, J. Vac. Sci. Technol. A 12, 889 (1994).