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Volumn 142-144, Issue , 2001, Pages 61-66

Filtered arc deposition and implantation of aluminium nitride

Author keywords

Aluminium nitride; Arc evaporation; Atomic force microscopy measurements; PIII; X Ray diffraction

Indexed keywords

ALUMINUM NITRIDE; CATHODES; ION IMPLANTATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SAPPHIRE; X RAY DIFFRACTION ANALYSIS;

EID: 0035387319     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(01)01075-1     Document Type: Article
Times cited : (16)

References (23)
  • 19
    • 0003495856 scopus 로고
    • Joint Committee for Powder Diffraction Standards, International Center for Diffraction Data, Park Lane
    • (1989) Powder Diffraction File


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.