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Volumn 385, Issue 1-2, 2001, Pages 281-292

Chemical-mechanical polishing of SiOC organosilicate glasses: The effect of film carbon content

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ATTACK; CHEMICAL MECHANICAL POLISHING; HYDROPHOBICITY; PERMITTIVITY; PH EFFECTS; SILICA; SLURRIES; SURFACE ROUGHNESS;

EID: 0035311224     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01925-8     Document Type: Article
Times cited : (23)

References (31)
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    • T.-M. Lu, S.P. Murarka, T.-S. Kuan, C.H. Ting (Eds.), Low-Dielectric Constant Materials-Synthesis and Applications in Microelectronics, San Francisco, USA, April 17-19, 1995.
    • N.H. Hendricks, K.S.Y. Lau, A.R. Smith, W.B. Wan, in: T.-M. Lu, S.P. Murarka, T.-S. Kuan, C.H. Ting (Eds.), Low-Dielectric Constant Materials-Synthesis and Applications in Microelectronics, San Francisco, USA, April 17-19, 1995. Mater. Res. Soc. Symp. Proc. 381 (1995) 59.
    • (1995) Mater. Res. Soc. Symp. Proc. , vol.381 , pp. 59
    • Hendricks, N.H.1    Lau, K.S.Y.2    Smith, A.R.3    Wan, W.B.4
  • 13
    • 0032299295 scopus 로고    scopus 로고
    • C. Chiang, P.S. Ho, T.-M. Lu, J.T. Wetzel (Eds.), Low-Dielectric Constant Materials IV, San Francisco, USA, April 14-16, 1998
    • S. Nitta, A. Jain, V. Pisupatti, W.N. Gill, P.C. Wayner, J.L. Plawsky, in: C. Chiang, P.S. Ho, T.-M. Lu, J.T. Wetzel (Eds.), Low-Dielectric Constant Materials IV, San Francisco, USA, April 14-16, 1998. Mater. Res. Soc. Symp. Proc. 511 (1998) 99.
    • (1998) Mater. Res. Soc. Symp. Proc. , vol.511 , pp. 99
    • Nitta, S.1    Jain, A.2    Pisupatti, V.3    Gill, W.N.4    Wayner, P.C.5    Plawsky, J.L.6
  • 20
    • 33847591874 scopus 로고    scopus 로고
    • United States Patent No. 5952243, Sept.
    • L. Forester, O.K. Choi, R. Hosseini, United States Patent No. 5952243, Sept. 1999.
    • (1999)
    • Forester, L.1    Choi, O.K.2    Hosseini, R.3
  • 24
    • 0029202047 scopus 로고
    • T.-M. Lu, S.P. Murarka, T.-S. Kuan, C.H. Ting. Low-Dielectric Constant Materials-Synthesis and Applications in Microelectronics, San Francisco, USA, April 17-19, 1995
    • J.M. Neirynck, S.P. Murarka, R.J. Gutmann, in: T.-M. Lu, S.P. Murarka, T.-S. Kuan, C.H. Ting. Low-Dielectric Constant Materials-Synthesis and Applications in Microelectronics, San Francisco, USA, April 17-19, 1995. Mater. Res. Soc. Symp. Proc. 381 (1995) 229.
    • (1995) Mater. Res. Soc. Symp. Proc. , vol.381 , pp. 229
    • Neirynck, J.M.1    Murarka, S.P.2    Gutmann, R.J.3
  • 25
    • 85031521261 scopus 로고    scopus 로고
    • R. Havemann, J. Schmilz, H. Komiyama, K. Tsubouchi. Advanced Metallization and Interconnect Systems for ULSI Applications in 1996, Boston, USA, October 1-3, 1996
    • D. Permana, S.P. Murarka, M.G. Lee, S.I. Beilin, in: R. Havemann, J. Schmilz, H. Komiyama, K. Tsubouchi. Advanced Metallization and Interconnect Systems for ULSI Applications in 1996, Boston, USA, October 1-3, 1996, Proc. Adv. Metall. Intercon. Systems ULSI Appl. 1996 (1997) 539.
    • (1997) Proc. Adv. Metall. Intercon. Systems ULSI Appl. , vol.1996 , pp. 539
    • Permana, D.1    Murarka, S.P.2    Lee, M.G.3    Beilin, S.I.4
  • 30
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    • Austin, TX, private communication
    • C. Jin, SEMATECH, Austin, TX, private communication.
    • SEMATECH
    • Jin, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.