Dielectric breakdown in (Pb,La)(Zr,Ti)O3 ferroelectric thin films with Pt and oxide electrodes

Journal of Applied Physics

Volumn 87, Issue 4, 2000, Pages 1925-1931

  Stolichnov, I ^a   Tagantsev, A ^a   Setter, N ^a   Okhonin, S ^a   Fazan, P ^a   Cross, J S ^b   Tsukada, M ^b  

^a EPFL   (Switzerland)

^b FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000757659     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372114     Document Type: Article

References (23)

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