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Volumn 11, Issue 2, 2001, Pages 153-159

On the out-of-plane deformation of V-shaped micromachined beams

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER BEAMS; DEFLECTION (STRUCTURES); DEFORMATION; ELECTRON MICROSCOPES; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; RESIDUAL STRESSES; SILICA; SUSPENSIONS (COMPONENTS);

EID: 0035281355     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/11/2/311     Document Type: Article
Times cited : (13)

References (21)
  • 8
    • 0032306316 scopus 로고    scopus 로고
    • Mass-producible monolithic silicon probes for scanning probe microscopes Sensors Actuators A
    • (1998) , vol.71 , pp. 233-237
    • Liu, C.1    Gamble, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.