Scanning tunneling microscopy study of the Si(111)-(√3 × √3)-Pb mosaic phase

Surface Science

Volumn 377-379, Issue , 1997, Pages 45-49

  Gomez Rodriguez J M ^a   Veuillen, J Y ^b   Cinti, R C ^b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

Epitaxy; Growth; Scanning tunneling microscopy; Scanning tunneling spectroscopies; Silicon; Surface electronic phenomena; Surface structure, morphology, roughness and topography

Indexed keywords

CHARGE TRANSFER; CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; IMAGE ANALYSIS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; SURFACE PHENOMENA; SURFACE ROUGHNESS;

ADATOMS; MOSAIC PHASE; SCANNING TUNNELING SPECTROSCOPY; SURFACE TOPOGRAPHY;

SILICON ALLOYS;

EID: 4243290381     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)01325-3     Document Type: Article

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