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Volumn 10, Issue 2, 2001, Pages 117-124
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Real-time monitoring, growth kinetics and properties of carbon based materials deposited by sputtering
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Author keywords
Amorphous carbon; Ellipsometry; Modeling; Sputtering
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Indexed keywords
ADSORPTION;
CARBON NITRIDE;
DEPOSITION;
DIFFUSION IN SOLIDS;
ELLIPSOMETRY;
FILM GROWTH;
MAGNETRON SPUTTERING;
NUCLEATION;
OPTICAL PROPERTIES;
MULTIWAVELENGTH ELLIPSOMETRY;
SPECTROSCOPIC ELLIPSOMETRY;
AMORPHOUS FILMS;
SPUTTERING;
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EID: 0035248136
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-9635(00)00457-X Document Type: Article |
Times cited : (16)
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References (22)
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