The deformation regimes of the yield point of silicon

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 81, Issue 1, 2001, Pages 145-152

  Georg Brion, Hans ^b  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; DEFORMATION; DOPING (ADDITIVES); HIGH TEMPERATURE EFFECTS; SILICON; STRAIN;

STRAIN-RATES;

SINGLE CRYSTALS;

EID: 0035241141     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610108216624     Document Type: Article

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