Length and dimensional measurements at NIST

Journal of Research of the National Institute of Standards and Technology

Volumn 106, Issue 1, 2001, Pages 1-23

  Swyt, Dennis A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Atomic force; Dimensional; Interferometry; Length; Measurements; Microscopes; Optical; Scanning electron; Scanning tunneling; Traceability

Indexed keywords

EID: 0035040858     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.106.002     Document Type: Article

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