Absolute interferometry with a 670-nm external cavity diode laser

Applied Optics

Volumn 38, Issue 28, 1999, Pages 5981-5994

  Stone, Jack A ^a   Stejskal, Alois ^a   Howard, Lowell ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001199708     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.005981     Document Type: Article

References (21)

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