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Volumn 104, Issue 3, 1999, Pages 225-252

The NIST length scale interferometer

Author keywords

Graduated scales; Interferometry; Length; Measurement assurance; Measurement uncertainty

Indexed keywords


EID: 0000486553     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.104.017     Document Type: Article
Times cited : (48)

References (28)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.