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Volumn 63, Issue 24, 2001, Pages 2453221-2453227
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Vacancy-related deep levels in n-type Si1-xGex strained layers
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
GERMANIUM;
PHOSPHORUS;
SILICON;
ARTICLE;
CHEMICAL COMPOSITION;
ENTHALPY;
IRRADIATION;
NONLINEAR SYSTEM;
QUANTUM MECHANICS;
SPECTROSCOPY;
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EID: 0034894727
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (22)
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References (34)
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