Growth, characterization and modeling of alternating-current thin-film electroluminescent devices

Progress in Crystal Growth and Characterization of Materials

Volumn 42, Issue 3, 2001, Pages 65-164

  Krasnov, Alex N ^a   Hofstra, Peter G ^a  

^a Luxell Technologies Inc   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AC MACHINERY; CHARGE TRANSFER; COMPUTER SIMULATION; ELECTRIC NETWORK ANALYSIS; ELECTRIC SPACE CHARGE; ELECTRON TUNNELING; GRAIN SIZE AND SHAPE; MAGNETIC THIN FILM DEVICES; MONTE CARLO METHODS; OPTOELECTRONIC DEVICES; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY;

ALTERNATING CURRENT THIN-FILM ELECTROLUMINESCENT (ACTFEL) DEVICES;

LUMINESCENT DEVICES;

EID: 0034870489     PISSN: 09608974     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0960-8974(01)00003-1     Document Type: Article

References (218)

1. Guidelines for evaluating and expressing the uncertainty of NIST measurement results
2. Electroluminescence