Alternating-current thin-film electro-luminescent devices: Effect of fabrication conditions on aging and failure defect formation

Progress in Crystal Growth and Characterization of Materials

Volumn 37, Issue 2, 1998, Pages 123-167

  Krasnov, Alex N ^a  

^a Luxell Technologies Inc   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CRYSTAL DEFECTS; DELAMINATION; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRODES; ETCHING; FAILURE ANALYSIS; FILM GROWTH; METALLIZING; MOISTURE; SEMICONDUCTOR GROWTH; THIN FILM DEVICES;

ALTERNATING CURRENT THIN FILM ELECTROLUMINESCENT (ACTFEL) DEVICES; ION MIGRATION;

LUMINESCENT DEVICES;

EID: 0032265991     PISSN: 09608974     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0960-8974(99)00003-0     Document Type: Article

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