Use of photodepolarization spectra for diagnostics and characterization of alternating current thin-film electroluminescent (ACTFEL) devices

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3359, Issue , 1997, Pages 512-518

  Vlasenko, N A ^a   Beletskii, A I ^a   Denisova, Z L ^a   Kononets, Ya F ^a   Veligura, L I ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

Experiment; Photodepolarization spectroscopy methodology; Polarization charge; Simulation

Indexed keywords

CHARACTERIZATION; COMPUTER SIMULATION; ELECTROLUMINESCENCE; LIGHT POLARIZATION; NONDESTRUCTIVE EXAMINATION; PHOTOCURRENTS; SEMICONDUCTING ZINC COMPOUNDS; SPECTROSCOPIC ANALYSIS; STRONTIUM COMPOUNDS; THIN FILMS;

ALTERNATING CURRENT THIN-FILM ELECTROLUMINESCENT DEVICES; PHOTODEPOLARIZATION SPECTRA;

LUMINESCENT DEVICES;

EID: 0031394240     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.306271     Document Type: Conference Paper

References (8)

1. Physical processes in thin-film electroluminescent MSM, MISM and MISIM structures
2. Atomic layer epitaxy for producing EL thin-films
3. TFEL color by white
4. On physical model of aging behaviour of ALE ZnS:Mn ACTFEL devices
5. On causes of instability in beginning of aging of evaporated ZnS:Mn ACTFEL devices