Using syndrome compression for memory built-in self-diagnosis

International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Volumn , Issue , 2001, Pages 303-306

  Li, J F ^a   Tzeng, R S ^a   Wu, C W ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS); DATA COMPRESSION; MICROPROCESSOR CHIPS; RANDOM ACCESS STORAGE; TREES (MATHEMATICS);

BUILT-IN SELF-DIAGNOSIS (BISD);

EMBEDDED SYSTEMS;

EID: 0034848722     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

1. A method of flexible catch RAM display for memory testing
2. Hardware compression speeds on bitmap fail display
3. Using march tests to test SRAMs
4. Diagnosis and repair of memory with coupling faults
5. Diagnostic testing of embedded memories using BIST
6. RAM diagnostic tests
7. A realistic fault model and test algorithm for static random access memories
8. A built-in self-test and self-diagnosis scheme for embedded SRAM
9. Error catch and analysis for semiconductor memories using March tests
10. A programmable BIST architecture for clusters of multiple-port SRAMs
11. A configurable DRAM macro design for 2112 derivative organizations to be synthesized using a memory generator
12. A method for the construction of minimum-redundancy codes