Study of grafted silane molecules on silica surface with an atomic force microscope

Langmuir

Volumn 12, Issue 21, 1996, Pages 5126-5137

  Gauthier, S ^a   Aime J P ^a   Bouhacina, T ^a   Attias, A J ^b   Desbat, B ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

^b ONERA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000407072     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la951098b     Document Type: Article

References (35)

1. Silanes and Other Coupling Agents, Mittal, K. L., Ed.; 1992.
2. Burhnam, N. A.; Colton, R. J. Vac. Sci. Technol. A 1989, 4, 2906.
3. Salmeron, M. in MRS Bull. 1993, 18, 20.
4. Radmacher, M.; Tillman, R. W.; Fritz, M.; Gaub, H. E. Science 1992, 257, 1900.
5. Warmack, R. J.; Zheng, X. Y.; Thundat, T.; Allison, D. P. Rev. Sci. Instrum. 1994, 65, 394.
6. Overney, R. M.; Meyer, E.; Frommer, J.; Brodbeck, D.; Lüthi, R.; Howald, L.; Güntherodt, H. J.; Fujihira, M.; Takano, H.; Gotoh, Y. Nature 1992, 359, 133.
7. Meyer, E.; Overney, R. M.; Brodbeck, D.; Howald, L.; Luthi, R.; Frommer, J.; Güntherodt, H. J. Phys. Rev. Lett. 1992, 69, 1777.
8. Overney, R. M.; Meyer, E MRS Bull. 1993, 18, 26.
9. Frisbie, C. D.; Rozsnyai, L. F.; Noy, A.; Wrighton, M. S.; Lieber, C. M. Science 1994, 265, 2071.
10. Wilbur, J. L.; Biebuck, H. A.; MacDonald, J. C.; Whitesides, G. M. Langmuir 1995, 11, 825.
11. Kazor, A.; Boyd, I. W. Electron. Lett. 1993, 29, 115.
12. Prabhakaran, K.; Kobayashi, Y.; Ogino, T. Surf. Sci. 1993, 290, 239.
13. Angst, D. L.; Simmons, G. W. Langmuir 1991, 7, 2236.
14. Azzopardi, M. J. Thèse Université Paris VI, 1994.
15. Blum, F. D.; Meesiri, W.; Kang, H. J.; Gamgogi, J. E. In Silanes and Other Coupling Agents Mittal, K. L., Ed.; 1992; p 181.
16. Osterholtz, F. D.; Pohl, E. R. In Silanes and Other Coupling Agents Mittal, K. L., Ed.; 1992; p 119.
17. Leyden, D. E.; Atwater, J. P. In Silanes and Other Coupling Agents Mittal, K. L., Ed.; 1992; p 143.
18. Digital Instrument. A Nanoscope III is used.
19. Johnson, K. L.; Kendall, K.; Roberts, A. D. Proc. R. Soc. London 1971, A324, 301.
20. Maugis, D. J. Colloid Interface Sci. 1992, 150 (1), 243.
21. Kendall, K. Science 1994, 263, 1720.
22. Aimé, J. P.; Elkaakour, Z.; Odin, C.; Bouhacina, T.; Michel, D.; Curély, J.; Dautant, A. J. Appl. Phys. 1994, 76, 754.
23. Griffith, J. E.; Grigg, D. A. J. Appl. Phys. 1993, 74, R83.
24. Odin, C.; Aimé, J. P.; Elkaakour, Z.; Bouhacina, T. Surf. Sci. 1994, 317, 321.
25. Clevand, J. P.; Manne, S.; Bocek, D.; Hansma, P. K. Sci. Instrum. 1993, 64, 403.
26. For instance, AFM cantilevers proposed by Digital Instrument (NanoProbes).
27. Aimé, J. P.; Elkaakour, Z.; Gauthier, S.; Michel, D.; Bouhacina, T.; Curély, J. Surf. Sci. 1995, 329, 149.
28. Devreux, F.; Boilot, J. P.; Chaput, F.; Lecomte, A. Phys. Rev. A 1990, 41, 6901.
29. Pohl, E. R.; Osterholtz, F. D. In Silanes, Surfaces, and Interfaces; Leyden, D. E., Ed.; Gordon and Breach: New York, 1986.
30. Barquins, M. In Wear and Friction of Elastomer; Denton, R., Keshavan, M. K., Ed.; ASTM: Philadelphia, PA, 1992.
31. Carpick, R. W.; Agraït, N.; Ogletree, D. F.; Salmeron, M. J. Vac. Sci. Technol. B, in press: STM'95 (Aspen, USA).
32. Yoshizawa, H.; Chen, Y. L.; Israelachvili, J. J. Phys. Chem. 1993, 97, 4128.
33. Briscoe, B. J. In Fundamentals of friction : Macroscopic and microscopic processes; Singer, I. L., Pollock, H. M., Eds.; NATO ASI Series 1992; p 167.
34. Maugis, D. J. Mater. Sci. 1985, 20, 3041.
35. Fujiwara, I.; Kamei, T.; Seto, J. Jpn. J. Appl. Phys. 1995, 34, 4932.