Windows in ellipsometry measurements

Applied Optics

Volumn 38, Issue 22, 1999, Pages 4784-4789

  Jellison, Gerald E ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING; FUSED SILICA; LIGHT MODULATORS; LIGHT POLARIZATION; OPTICAL INSTRUMENT LENSES;

POLARIZATION-STATE DETECTORS; POLARIZATION-STATE GENERATORS;

ELLIPSOMETRY;

EID: 0032607011     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.004784     Document Type: Article

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