Glass transition temperature of poly(tert-butyl methacrylate) Langmuir-Blodgett film and spin-coated film by X-ray reflectivity and ellipsometry

Langmuir

Volumn 16, Issue 5, 2000, Pages 2351-2355

  See, Yoon Ki ^a   Cha, Junhoe ^a   Chang, Taihyun ^a   Ree, Moonhor ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELLIPSOMETRY; GLASS TRANSITION; PLASTIC FILMS; SILICON; SILICON WAFERS;

POLYTERTBUTYL METHACRYLATE; SPIN-COATED FILM;

LANGMUIR BLODGETT FILMS;

EID: 0033876015     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la991074v     Document Type: Article

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