SCOPUS 정보 검색 플랫폼

Volumn 234-236, Issue , 1997, Pages 806-809

X-ray diffraction analysis of internal stresses in the dislocation structure of cyclically deformed nickel single crystals

(3) Hecker, M a Thiele, E a Holste, C a

a DRESDEN UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

Internal stresses; Persistent slip bands; X ray diffraction

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); PLASTIC DEFORMATION; RESIDUAL STRESSES; SINGLE CRYSTALS; STRESS ANALYSIS; STRESS CONCENTRATION; VOLUME FRACTION; X RAY CRYSTALLOGRAPHY; YIELD STRESS;

PERSISTENT SLIP BANDS (PSBS);

NICKEL;

EID: 0031213266 PISSN: 09215093 EISSN: None Source Type: Journal
DOI: 10.1016/s0921-5093(97)00370-5 Document Type: Article

Times cited : (23)

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