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Volumn 38, Issue 14, 2000, Pages 3305-3341

Modelling, control and simulation of an IC wafer fabrication system: A generalized stochastic coloured timed Petri Net approach

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FABRICATION; PERFORMANCE; PETRI NETS; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON WAFERS;

EID: 0034692664     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/002075400418270     Document Type: Article
Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.