Scheduling of semiconductor test facility via petri nets and hybrid heuristic search

IEEE Transactions on Semiconductor Manufacturing

Volumn 11, Issue 3, 1998, Pages 384-393

  Xiong, Huanxin Henry ^a,c   Zhou, MengChu ^b,c  

^a NOKIA RESEARCH CENTER   (United States)

^b NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^c IEEE   (United States)

Author keywords

Heuristic search; Hybrid strategy; Petri net; Scheduling; Semiconductor test

Indexed keywords

ALGORITHMS; HEURISTIC METHODS; PETRI NETS; SCHEDULING; SEMICONDUCTOR DEVICE MODELS;

HYBRID HEURISTIC SEARCH;

SEMICONDUCTOR DEVICE TESTING;

EID: 0032138965     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.705373     Document Type: Article

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