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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 19, 2000, Pages 12660-12663

Imaging β-SiC(100) c(4×2) surface down dimers by empty electronic states scanning tunneling microscopy

(3) Derycke, V a Fonteneau, P a Soukiassian, P a

a DIF (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIMER; SILICON CARBIDE;

ARTICLE; ATOM; MODEL; SCANNING TUNNELING MICROSCOPY;

EID: 0034668505 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.12660 Document Type: Article

Times cited : (15)

References (19)

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