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Volumn 13, Issue 3, 2000, Pages 391-394

Resist characteristics with electron beam and SR exposures

Author keywords

CD uniformity; Chemically amplified resist; Sensitivity; Synchrotron radiation

Indexed keywords

ARTICLE; ELECTRON BEAM; ILLUMINATION; RADIATION EXPOSURE; RADIATION PROTECTION; SEMICONDUCTOR; SYNCHROTRON; TECHNIQUE;

EID: 0034583960     PISSN: 09149244     EISSN: None     Source Type: Journal    
DOI: 10.2494/photopolymer.13.391     Document Type: Article
Times cited : (3)

References (15)
  • 10
    • 0003668260 scopus 로고
    • Tokyo: Maruzen
    • (1993) th ed.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.