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Volumn 13, Issue 3, 2000, Pages 391-394
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Resist characteristics with electron beam and SR exposures
a b a c c
b
OHKA Amarica
*
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Author keywords
CD uniformity; Chemically amplified resist; Sensitivity; Synchrotron radiation
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Indexed keywords
ARTICLE;
ELECTRON BEAM;
ILLUMINATION;
RADIATION EXPOSURE;
RADIATION PROTECTION;
SEMICONDUCTOR;
SYNCHROTRON;
TECHNIQUE;
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EID: 0034583960
PISSN: 09149244
EISSN: None
Source Type: Journal
DOI: 10.2494/photopolymer.13.391 Document Type: Article |
Times cited : (3)
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References (15)
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