Temperature-dependence of steady-state characteristics of SCR-type ESD protection circuits

Solid-State Electronics

Volumn 44, Issue 12, 2000, Pages 2139-2146

  Jang, Sheng Lyang ^a   Lin, Jeng Kuan ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC EQUIPMENT PROTECTION; ELECTROSTATICS; INTEGRATED CIRCUIT LAYOUT; MOSFET DEVICES; SEMICONDUCTING SILICON; SOLID STATE RECTIFIERS; TRIGGER CIRCUITS; ZENER EFFECT;

ELECTROSTATIC DISCHARGES (ESD); LOW-VOLTAGE ZENER DIODE TRIGGERS;

ZENER DIODES;

EID: 0034508092     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(00)00153-2     Document Type: Article

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