Comparison of conventional light scattering and speckle techniques concerning an in-process characterization of engineered surfaces

CIRP Annals - Manufacturing Technology

Volumn 49, Issue 1, 2000, Pages 419-422

  Lehmann, P ^a   Goch, G ^a  

^a UNIVERSITY OF BREMEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SCATTERING; OPTICAL CORRELATION; ROUGHNESS MEASUREMENT; SPECKLE;

ANGLE RESOLVED SCATTERING (ARS);

SURFACE ROUGHNESS;

EID: 0033690403     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)62979-5     Document Type: Article

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