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Volumn 15, Issue 13, 1999, Pages 4603-4612

Characterization of surface roughness of MCM-41 using methods of fractal analysis

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; ESTIMATION; FRACTALS; GAS ADSORPTION; MACROMOLECULES; MOLECULAR SIEVES; NEUTRON SCATTERING; POROUS MATERIALS; X RAY SCATTERING;

EID: 0032638845     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9816306     Document Type: Article
Times cited : (57)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.