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Volumn 15, Issue 13, 1999, Pages 4603-4612
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Characterization of surface roughness of MCM-41 using methods of fractal analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL MICROSTRUCTURE;
ESTIMATION;
FRACTALS;
GAS ADSORPTION;
MACROMOLECULES;
MOLECULAR SIEVES;
NEUTRON SCATTERING;
POROUS MATERIALS;
X RAY SCATTERING;
FRACTAL ANALYSIS;
MERCURY POROSIMETRY;
SURFACE ROUGHNESS;
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EID: 0032638845
PISSN: 07437463
EISSN: None
Source Type: Journal
DOI: 10.1021/la9816306 Document Type: Article |
Times cited : (57)
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References (4)
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