Nucleation and evolution of Si1-xGex islands on Si(001)

Thin Solid Films

Volumn 380, Issue 1-2, 2000, Pages 46-50

  Volpi, F ^a   Portavoce, A ^a   Ronda, A ^a   Shi, Y ^a   Gay, J M ^a   Berbezier, I ^a  

^a CAMPUS DE LUMINY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); FILM GROWTH; MODAL ANALYSIS; MOLECULAR BEAM EPITAXY; MORPHOLOGY; NUCLEATION; PHASE TRANSITIONS; REACTION KINETICS; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; STRESS RELAXATION; THERMODYNAMIC STABILITY;

BIMODAL SIZE DISTRIBUTIONS; METASTABLE MORPHOLOGY;

SEMICONDUCTING FILMS;

EID: 0034496951     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01526-1     Document Type: Article

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