Elastic strain relaxation in Si1-xGex layers epitaxially grown on Si substrates

Surface Review and Letters

Volumn 5, Issue 1, 1998, Pages 133-138

  Berbezier, I ^a   Callas, B ^a   Derrien, J ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032395077     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X98000268     Document Type: Article

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