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Surface Review and Letters

Volumn 7, Issue 5-6, 2000, Pages 583-588

Microscopic understanding and control of surfaces and interfaces of compound semiconductors for mesoscopic devices

(1) Hasegawa, H a

a HOKKAIDO UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

CONDUCTANCE; CONFERENCE PAPER; ELECTROCHEMISTRY; MICROSCOPY; SEMICONDUCTOR; SPECTROSCOPY; SURFACE PROPERTY;

EID: 0034489146 PISSN: 0218625X EISSN: None Source Type: Journal
DOI: 10.1016/S0218-625X(00)00066-X Document Type: Conference Paper

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.