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Volumn 39, Issue 4 B, 2000, Pages 2439-2443
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Fabrication and characterization of novel oxide-free InP metal-insulator-semiconductor FETs having an ultra narrow Si surface quantum well
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Author keywords
ECR; InP; MISFET; Nitrogen plasma; Passivation; Si ICL; Silicon nitride
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Indexed keywords
ELECTRON CYCLOTRON RESONANCE;
INTERFACES (MATERIALS);
MOLECULAR BEAM EPITAXY;
NITRIDING;
PASSIVATION;
PLASMA APPLICATIONS;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTING SILICON;
SEMICONDUCTOR QUANTUM WELLS;
SILICON NITRIDE;
SURFACE STRUCTURE;
X RAY PHOTOELECTRON SPECTROSCOPY;
NOVEL OXIDE FREE INDIUMPHOSPHIDE;
PARTIAL NITRADATION;
ULTRA NARROW SILICON SURFACE QUANTUM WELL;
ULTRAHIGH VACUUM;
MISFET DEVICES;
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EID: 0033692006
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.39.2439 Document Type: Article |
Times cited : (7)
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References (14)
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