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Volumn 39, Issue 4 B, 2000, Pages 2439-2443

Fabrication and characterization of novel oxide-free InP metal-insulator-semiconductor FETs having an ultra narrow Si surface quantum well

Author keywords

ECR; InP; MISFET; Nitrogen plasma; Passivation; Si ICL; Silicon nitride

Indexed keywords

ELECTRON CYCLOTRON RESONANCE; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; NITRIDING; PASSIVATION; PLASMA APPLICATIONS; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTING SILICON; SEMICONDUCTOR QUANTUM WELLS; SILICON NITRIDE; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0033692006     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.2439     Document Type: Article
Times cited : (7)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.