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Volumn 47, Issue 6 III, 2000, Pages 2311-2315

Microscopic mechanisms of electron trapping by self-trapped holes and protons in amorphous SiO 2

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC CLUSTERS; COULOMBIC ATTRACTIVE CENTER; ELECTRON CAPTURE; HARTREE-FOCK CALCULATIONS; MICROSCOPIC MECHANISMS; OXIDE TRAPPED HOLES; SELF TRAPPED HOLES;

EID: 0034451993     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.903770     Document Type: Conference Paper
Times cited : (1)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.