|
Volumn 48, Issue 1, 1999, Pages 109-112
|
Quantum mechanical characterization of E′-type centers in a-SiOx films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
AMORPHOUS FILMS;
CRYSTAL ATOMIC STRUCTURE;
MATHEMATICAL MODELS;
QUANTUM THEORY;
SEMICONDUCTING SILICON COMPOUNDS;
SILICA;
HARTREE-FOCK CALCULATION;
SEMICONDUCTING FILMS;
|
EID: 0033190148
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-9317(99)00349-4 Document Type: Article |
Times cited : (8)
|
References (25)
|