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Volumn 48, Issue 1, 1999, Pages 109-112

Quantum mechanical characterization of E′-type centers in a-SiOx films

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CRYSTAL ATOMIC STRUCTURE; MATHEMATICAL MODELS; QUANTUM THEORY; SEMICONDUCTING SILICON COMPOUNDS; SILICA;

EID: 0033190148     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(99)00349-4     Document Type: Article
Times cited : (8)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.