Quantum mechanical investigation of positively charged defects in SiO2 thin film devices

Materials Research Society Symposium - Proceedings

Volumn 446, Issue , 1997, Pages 247-253

  Ferreira, Antonio M ^a   Karna, Shashi P ^a   Brothers, Charles P ^a   Pugh, Robert D ^a   Singaraju, Babu B K ^a   Vanheusden, Karel ^a   Warren, William L ^a   Devine, Roderick A B ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CHEMICAL BONDS; COMPUTATIONAL METHODS; DISSOCIATION; ELECTRONS; HYDROGEN; IONS; QUANTUM THEORY; SILICA;

HARTREE FOCK THEORY; MOLLER-PLESSET THEORY;

THIN FILM DEVICES;

EID: 0030648136     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)