Microscopic mechanisms of radiation-induced proton density decay in SiO2 films

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2408-2412

  Kama, S P ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTRON ABSORPTION; GROUND STATE; HYDROGEN; PHOTONS; POTENTIAL ENERGY; PROTONS; QUANTUM THEORY; RADIATION EFFECTS; SEMICONDUCTING FILMS; SEMICONDUCTING SILICON COMPOUNDS; SILICA;

HARTREE-FOCK METHOD; PROTON DENSITY DECAY;

THIN FILMS;

EID: 0032305989     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736479     Document Type: Article

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