Simulated superior performances of semiconductor superjunction devices

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1998, Pages 423-426

  Fujihira, Tatsuhiko ^a   Miyasaka, Yasushi ^a  

^a FUJI ELECTRIC CO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; LEAKAGE CURRENTS; SCHOTTKY BARRIER DIODES;

REVERSE LEAKAGE CURRENTS; SEMICONDUCTOR SUPERJUNCTION DEVICES;

SEMICONDUCTOR JUNCTIONS;

EID: 0031633245     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)