Spatio-temporal imaging of voltage pulses with an ultrafast scanning tunneling microscope

Applied Physics Letters

Volumn 70, Issue 20, 1997, Pages 2762-2764

  Jensen, Jacob R ^a   Keil, Ulrich D ^a   Hvam, Jørn M ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038207409     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118976     Document Type: Article

References (8)

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4. R. H. M. Groeneveld and H. van Kempen, Appl. Phys. Lett. 69, 2294 (1996).
5. U. D. Keil, J. R. Jensen, and J. M. Hvam, J. Appl. Phys. 81, 2929 (1997).
6. U. D. Keil, J. R. Jensen, and J. M. Hvam, Appl. Phys. Lett. 70, 2625 (1997).
7. U. D. Keil and J. M. Hvam, Technical Digest, EQEC '96, Hamburg, Germany.
8. S. Ramo, J. R. Whinnery, and T. Van Duzer, Fields and Waves in Communication Electronics, 3rd ed. (Wiley, New York, 1993).