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Volumn 17, Issue 1, 2000, Pages 105-110

Structural and Optical Characterization of Thick GaN Films Grown by the Direct Reaction of Metal Ga and NH3 in CVD Reactor

Author keywords

Crystal Quality; Direct Reaction; Growth; Metallic Ga; Thick GaN

Indexed keywords


EID: 0034396146     PISSN: 02561115     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02789262     Document Type: Article
Times cited : (2)

References (30)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.