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Volumn 219, Issue 1, 2000, Pages 215-225

Infrared 45° reflectometry of anisotropic ultrathin films and heterostructures

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EID: 0034344167     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200005)219:1<215::AID-PSSB215>3.0.CO;2-4     Document Type: Article
Times cited : (8)

References (37)
  • 24
    • 0039110013 scopus 로고
    • E. L. IVCHENKO and A. V. SELKIN, Zh. Eksper. Teor. Fiz. 76, 1836 (1979) Soviet Phys. -J. Exper. Theor. Phys. 49, 933 (1979)).
    • (1979) Soviet Phys. -J. Exper. Theor. Phys. , vol.49 , pp. 933


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.