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Volumn 170, Issue 2, 1998, Pages 337-342
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Theory of 45° reflectometry from metal surfaces
a b a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONIC PROPERTIES;
LIGHT REFLECTION;
MATHEMATICAL MODELS;
REFLECTOMETERS;
SPECTROSCOPY;
SURFACE PROPERTIES;
FRESNEL FORMULA;
OPTICAL SPECTROSCOPY;
SEMICONDUCTING FILMS;
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EID: 0032295293
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-396X(199812)170:2<337::AID-PSSA337>3.0.CO;2-N Document Type: Article |
Times cited : (6)
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References (17)
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