Infrared 45° reflectometry of very thin films

Journal of Applied Physics

Volumn 86, Issue 3, 1999, Pages 1404-1409

  Silva Castillo, A ^a   Perez Rodriguez F ^a  

^a BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000761333     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370902     Document Type: Article

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