Characterization of lead lanthanum titanate thin films grown on fused quartz using MOCVD

Thin Solid Films

Volumn 289, Issue 1-2, 1996, Pages 59-64

  Chen, H Y ^a   Lin, J ^a   Tan, K L ^a   Feng, Z C ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b EMCORE CORPORATION   (United States)

Author keywords

Chemical vapour deposition; Fourier transform infrared spectroscopy; Raman scattering; X ray diffraction; X ray photoelectron spectroscopy

Indexed keywords

CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; METALLORGANIC CHEMICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; QUARTZ; RAMAN SPECTROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

DIFFUSE REFLECTANCE INFRARED; FOURIER TRANSFORM SPECTROSCOPY; FUSED QUARTZ; LEAD LANTHANUM TITANATE; RAMAN SCATTERING SPECTROSCOPY;

LEAD COMPOUNDS;

EID: 0030286464     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08874-8     Document Type: Article

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