-
1
-
-
0026261507
-
-
Geideman, W. A. IEEE Trans. Ultrason., Ferroelect., Freq. Control 1991, 38, 704-711.
-
(1991)
IEEE Trans. Ultrason., Ferroelect., Freq. Control
, vol.38
, pp. 704-711
-
-
Geideman, W.A.1
-
3
-
-
0027887885
-
-
Sayer, M.; Barrow, D.; Zou, L.; Kumar, C. V. R. V.; Noteboon, B.; Knapik, D. A.; Schnidel, D. W.; Hutchins, D. A. Mater. Res. Soc. Symp. Proc. 1993, 370, 37-46.
-
(1993)
Mater. Res. Soc. Symp. Proc.
, vol.370
, pp. 37-46
-
-
Sayer, M.1
Barrow, D.2
Zou, L.3
Kumar, C.V.R.V.4
Noteboon, B.5
Knapik, D.A.6
Schnidel, D.W.7
Hutchins, D.A.8
-
4
-
-
0007960840
-
-
Sanchez, L. E.; Wu, S.; Naik, I. K. Appl. Phys. Lett. 1990, 56, 2399.
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 2399
-
-
Sanchez, L.E.1
Wu, S.2
Naik, I.K.3
-
5
-
-
0003526535
-
-
Okahata, Y.; Yokobori, M.; Ebara, Y.; Eboto, H.; Ariga, K. Langmuir 1990, 6, 1148.
-
(1990)
Langmuir
, vol.6
, pp. 1148
-
-
Okahata, Y.1
Yokobori, M.2
Ebara, Y.3
Eboto, H.4
Ariga, K.5
-
11
-
-
0027875637
-
-
Patel, A.; Logan, E. A.; Nicklin, R.; Hasdell, N. B.; Whatmore, R. W.; Uren, M. Mater. Res. Soc. Symp. Proc. 1993, 310, 447-452.
-
(1993)
Mater. Res. Soc. Symp. Proc.
, vol.310
, pp. 447-452
-
-
Patel, A.1
Logan, E.A.2
Nicklin, R.3
Hasdell, N.B.4
Whatmore, R.W.5
Uren, M.6
-
12
-
-
26044462246
-
-
Wood, V. E.; Busch, J. R.; Ramamurthi, S. D.; Swartz, S. L. J. Appl. Phys. 1992, 71, 4557-4566.
-
(1992)
J. Appl. Phys.
, vol.71
, pp. 4557-4566
-
-
Wood, V.E.1
Busch, J.R.2
Ramamurthi, S.D.3
Swartz, S.L.4
-
15
-
-
0000054881
-
-
Chidsey, C. E. D.; Porter, M. D.; Allara, D. L. J. Electrochem. Soc. 1986, 133, 130.
-
(1986)
J. Electrochem. Soc.
, vol.133
, pp. 130
-
-
Chidsey, C.E.D.1
Porter, M.D.2
Allara, D.L.3
-
20
-
-
0023307987
-
-
Troughton, E. B.; Bain, C. D.; Whitesides, G. M.; Nuzzo, R G.; Allara, D. L.; Porter, M. D. Langmuir 1988, 4, 365-385.
-
(1988)
Langmuir
, vol.4
, pp. 365-385
-
-
Troughton, E.B.1
Bain, C.D.2
Whitesides, G.M.3
Nuzzo, R.G.4
Allara, D.L.5
Porter, M.D.6
-
21
-
-
84930010586
-
-
Lunt, S. R.; Santagangelo, P. G.; Lewis, N. S. J. Voc. Sci. Technol. 1991, B9, 2333-2336.
-
(1991)
J. Voc. Sci. Technol.
, vol.B9
, pp. 2333-2336
-
-
Lunt, S.R.1
Santagangelo, P.G.2
Lewis, N.S.3
-
22
-
-
84866654986
-
-
Nakagawa, O. S.; Ashok, S.; Sheen, C. W.; Martensson, J.; Allara, D. L. Jpn. J. Appl. Phys. 1991, 30, 3759-3762.
-
(1991)
Jpn. J. Appl. Phys.
, vol.30
, pp. 3759-3762
-
-
Nakagawa, O.S.1
Ashok, S.2
Sheen, C.W.3
Martensson, J.4
Allara, D.L.5
-
23
-
-
84996528794
-
-
Sheen, C. W.; Shi, J.-X.; Martensson, J.; Parikh, A. N.; Allara, D. L. J. Am. Chem. Soc. 1992, 114, 1514-1515.
-
(1992)
J. Am. Chem. Soc.
, vol.114
, pp. 1514-1515
-
-
Sheen, C.W.1
Shi, J.-X.2
Martensson, J.3
Parikh, A.N.4
Allara, D.L.5
-
28
-
-
0024701981
-
-
Wasserman, S. R.; Tao, Y.; Whitesides, G. M. Langmuir 1989, 5, 1074-1087.
-
(1989)
Langmuir
, vol.5
, pp. 1074-1087
-
-
Wasserman, S.R.1
Tao, Y.2
Whitesides, G.M.3
-
29
-
-
33749127816
-
-
Wasserman, S. R.; Whitesides, G. M.; Tidswell, I. M.; Ocko, B. M.; Pershan, P. S.; Axe, J. D. J. Am. Chem. Soc. 1989, 111, 5852.
-
(1989)
J. Am. Chem. Soc.
, vol.111
, pp. 5852
-
-
Wasserman, S.R.1
Whitesides, G.M.2
Tidswell, I.M.3
Ocko, B.M.4
Pershan, P.S.5
Axe, J.D.6
-
31
-
-
0025374136
-
-
Dubois, L. H.; Zegarski, B. R.; Nuzzo, R. G. J. Am. Chem. Soc. 1990, 112, 570-579.
-
(1990)
J. Am. Chem. Soc.
, vol.112
, pp. 570-579
-
-
Dubois, L.H.1
Zegarski, B.R.2
Nuzzo, R.G.3
-
33
-
-
0027926177
-
-
Lopez, G. P.; Biebuyck, H. A.; Whitesides, G. M. Science 1993, 260, 647-649.
-
(1993)
Science
, vol.260
, pp. 647-649
-
-
Lopez, G.P.1
Biebuyck, H.A.2
Whitesides, G.M.3
-
35
-
-
0002754017
-
-
Pale-Grosdemange, C.; Simon, E. S.; Prime, K. L.; Whitesides, G. M. J. Am. Chem. Soc. 1991, 773, 12-20.
-
(1991)
J. Am. Chem. Soc.
, vol.773
, pp. 12-20
-
-
Pale-Grosdemange, C.1
Simon, E.S.2
Prime, K.L.3
Whitesides, G.M.4
-
36
-
-
0000951763
-
-
Lopez, G. P.; Albers, M. W.; Schreiber, S. L.; Carroll, R.; Peralta, E.; Whitesides, G. M. J. Am. Chem. Soc. 1993, 115, 5877-5878.
-
(1993)
J. Am. Chem. Soc.
, vol.115
, pp. 5877-5878
-
-
Lopez, G.P.1
Albers, M.W.2
Schreiber, S.L.3
Carroll, R.4
Peralta, E.5
Whitesides, G.M.6
-
37
-
-
0026225161
-
-
Häussling, L.; Ringsdorf, H.; Schmitt, F.-J.; Knoll, W. Langmuir 1991, 7, 1837-40.
-
(1991)
Langmuir
, vol.7
, pp. 1837-1840
-
-
Häussling, L.1
Ringsdorf, H.2
Schmitt, F.-J.3
Knoll, W.4
-
38
-
-
0000425490
-
-
Lopez, G. P.; Biebuyck, H. A.; Haerter, R.; Kumar, A.; Whitesides, G. M. J. Am. Chem. Soc. 1993, 115, 10774-10781.
-
(1993)
J. Am. Chem. Soc.
, vol.115
, pp. 10774-10781
-
-
Lopez, G.P.1
Biebuyck, H.A.2
Haerter, R.3
Kumar, A.4
Whitesides, G.M.5
-
42
-
-
7244242962
-
-
Lercel, M. J.; Redinbo, G. F.; Allara, D. L. Appl. Phys. Lett. 1994, 65, 974.
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 974
-
-
Lercel, M.J.1
Redinbo, G.F.2
Allara, D.L.3
-
43
-
-
0006163257
-
-
Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559-3568.
-
(1987)
J. Am. Chem. Soc.
, vol.109
, pp. 3559-3568
-
-
Porter, M.D.1
Bright, T.B.2
Allara, D.L.3
Chidsey, C.E.D.4
-
45
-
-
0000992383
-
-
Laibinis, P. E.; Bain, C. D.; Whitesides, G. M. J. Phys. Chem. 1991, 95, 7017.
-
(1991)
J. Phys. Chem.
, vol.95
, pp. 7017
-
-
Laibinis, P.E.1
Bain, C.D.2
Whitesides, G.M.3
-
46
-
-
33845281250
-
-
Nuzzo, R. G.; Zegarski, B. R.; Dubois, L. H. J. Am. Chem. Soc. 1987, 109, 733.
-
(1987)
J. Am. Chem. Soc.
, vol.109
, pp. 733
-
-
Nuzzo, R.G.1
Zegarski, B.R.2
Dubois, L.H.3
-
47
-
-
0000388302
-
-
Cheng, S. S.; Scherson, D. A.; Sukenik, C. N. J. Am. Chem. Soc. 1992, 114, 5436.
-
(1992)
J. Am. Chem. Soc.
, vol.114
, pp. 5436
-
-
Cheng, S.S.1
Scherson, D.A.2
Sukenik, C.N.3
-
49
-
-
84972876926
-
-
Schwartz, R. W.; Bunker, B. C.; Dimos, D. B.; Assink, R. A.; Tuttle, B. A.; Tallant, D. R.; Weinstock, I. A. Int. Ferroelectrics 1992, 2, 243.
-
(1992)
Int. Ferroelectrics
, vol.2
, pp. 243
-
-
Schwartz, R.W.1
Bunker, B.C.2
Dimos, D.B.3
Assink, R.A.4
Tuttle, B.A.5
Tallant, D.R.6
Weinstock, I.A.7
-
53
-
-
0003459529
-
-
Perkin-Elmer Corp.: Eden Prairie, MN
-
Wagner, C. D.; Riggs, W. M.; Davis, L. E.; Moulder, J. F.; Muilenberg, G. E. Handbook of X-ray Photoelectron Spectroscopy; Perkin-Elmer Corp.: Eden Prairie, MN, 1979.
-
(1979)
Handbook of X-ray Photoelectron Spectroscopy
-
-
Wagner, C.D.1
Riggs, W.M.2
Davis, L.E.3
Moulder, J.F.4
Muilenberg, G.E.5
-
54
-
-
85085783252
-
-
note
-
28
-
-
-
-
55
-
-
0003808259
-
-
North-Holland: Amsterdam
-
The roughness of the PZT thin film was examined by atomic force microscopy of a plasma-cleaned PZT sample using a Digital Instruments Nanoscope II in contact mode. The average peak-to-valley height was ∼200 Å with an average distance between peaks of about 0.5 μm. The roughness and partial transparency of the PZT thin film (thickness 0.4 μm) introduced substantial ambiguities in the estimation of its optical constants (index of refraction and extinction coefficient). Under these conditions, it was not possible to employ ellipsometry to measure the thickness of a SAM of OTS (expected thickness ∼26 Å when in extended all-trans configuration). For a detailed discussion of the principles and limitations of ellipsometric measurement of thin films, please see: Azzam. R. M. A.; Bashara, N. M. Ellipsometry and Polarized Light; North-Holland: Amsterdam, 1977.
-
(1977)
Ellipsometry and Polarized Light
-
-
Azzam, R.M.A.1
Bashara, N.M.2
-
56
-
-
85085783256
-
-
note
-
28
-
-
-
-
57
-
-
36449008717
-
-
Qian, Z.; Xiao, D.; Zhu, J.; Li, Z.; Zuo, C. J. Appl. Phys. 1993, 74, 224-227.
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 224-227
-
-
Qian, Z.1
Xiao, D.2
Zhu, J.3
Li, Z.4
Zuo, C.5
-
58
-
-
0001454580
-
-
Lau, W. M.; Bello, I.; Sayer, M.; Zou, L. Appl. Phys. Lett. 1994, 64, 300-302.
-
(1994)
Appl. Phys. Lett.
, vol.64
, pp. 300-302
-
-
Lau, W.M.1
Bello, I.2
Sayer, M.3
Zou, L.4
-
62
-
-
0009010764
-
-
Carley, A. F.; Rassias, S.; Roberts, M. W. Surf. Sci. 1983, 135, 35.
-
(1983)
Surf. Sci.
, vol.135
, pp. 35
-
-
Carley, A.F.1
Rassias, S.2
Roberts, M.W.3
-
63
-
-
5244250798
-
-
note
-
2O produces a partially-resolved O 1s state shifted by ∼2 eV (i.e. at ∼531 eV). The same result was obtained even when sputtering with lower energy (400 eV) ions was performed. Furthermore, angle-resolved spectra of the O 1s peak at takeoff angles of 15, 20, 30, 40, and 90° demonstrate a peak at ∼531 eV with progressively smaller relative intensity. It is, thus, clear that the hydroxide species is present in a very thin surface layer.
-
-
-
-
64
-
-
0005388546
-
-
Zomorrodian, A.; Mesarwi, A.; Wu, N. J.; Ignatiev, A. Appl. Surf. Sci. 1994, 90, 343-348.
-
(1994)
Appl. Surf. Sci.
, vol.90
, pp. 343-348
-
-
Zomorrodian, A.1
Mesarwi, A.2
Wu, N.J.3
Ignatiev, A.4
-
65
-
-
0028744569
-
-
Barr, T. L.; Seal, S.; Chen, L. M.; Kao, C. C. Thin Solid Films 1994, 253, 277-284.
-
(1994)
Thin Solid Films
, vol.253
, pp. 277-284
-
-
Barr, T.L.1
Seal, S.2
Chen, L.M.3
Kao, C.C.4
-
67
-
-
0040855511
-
-
Murata, M.; Wakino, K.; Ikeda, S. J. Electron Spectrosc. Relat. Phenom. 1975, 6, 459-464.
-
(1975)
J. Electron Spectrosc. Relat. Phenom.
, vol.6
, pp. 459-464
-
-
Murata, M.1
Wakino, K.2
Ikeda, S.3
-
68
-
-
0026822998
-
-
Kallury, K. M. R.; Thompson, M.; Tripp, C. P.; Hair, M. L. Langmuir 1992, 8, 947-954.
-
(1992)
Langmuir
, vol.8
, pp. 947-954
-
-
Kallury, K.M.R.1
Thompson, M.2
Tripp, C.P.3
Hair, M.L.4
|