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Volumn 12, Issue 11, 1996, Pages 2830-2836

Formation and stability of self-assembled monolayers on thin films of lead zirconate titanate (PZT)

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EID: 0343881496     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la951072k     Document Type: Article
Times cited : (21)

References (68)
  • 54
    • 85085783252 scopus 로고    scopus 로고
    • note
    • 28
  • 55
    • 0003808259 scopus 로고
    • North-Holland: Amsterdam
    • The roughness of the PZT thin film was examined by atomic force microscopy of a plasma-cleaned PZT sample using a Digital Instruments Nanoscope II in contact mode. The average peak-to-valley height was ∼200 Å with an average distance between peaks of about 0.5 μm. The roughness and partial transparency of the PZT thin film (thickness 0.4 μm) introduced substantial ambiguities in the estimation of its optical constants (index of refraction and extinction coefficient). Under these conditions, it was not possible to employ ellipsometry to measure the thickness of a SAM of OTS (expected thickness ∼26 Å when in extended all-trans configuration). For a detailed discussion of the principles and limitations of ellipsometric measurement of thin films, please see: Azzam. R. M. A.; Bashara, N. M. Ellipsometry and Polarized Light; North-Holland: Amsterdam, 1977.
    • (1977) Ellipsometry and Polarized Light
    • Azzam, R.M.A.1    Bashara, N.M.2
  • 56
    • 85085783256 scopus 로고    scopus 로고
    • note
    • 28
  • 63
    • 5244250798 scopus 로고    scopus 로고
    • note
    • 2O produces a partially-resolved O 1s state shifted by ∼2 eV (i.e. at ∼531 eV). The same result was obtained even when sputtering with lower energy (400 eV) ions was performed. Furthermore, angle-resolved spectra of the O 1s peak at takeoff angles of 15, 20, 30, 40, and 90° demonstrate a peak at ∼531 eV with progressively smaller relative intensity. It is, thus, clear that the hydroxide species is present in a very thin surface layer.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.