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Volumn 5, Issue 1, 2000, Pages 7-20

Effect of oxygen plasma on growth, structure and ferroelectric properties of SrBi2Ta2O9 thin films formed by pulsed laser ablation technique

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; ELECTRODES; FERROELECTRICITY; FILM GROWTH; ION BOMBARDMENT; LASER ABLATION; LASER PULSES; NUCLEATION; PLASMAS; STRONTIUM COMPOUNDS;

EID: 0034249603     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1009929109536     Document Type: Article
Times cited : (6)

References (30)
  • 26
    • 5244279562 scopus 로고
    • J.I. Pankov ed., Academic Press, NY
    • F.J. Kampas, in Semiconductors and Semimetals J.I. Pankov ed., Vol 21, Part A (Academic Press, NY, 1984), p. 159.
    • (1984) Semiconductors and Semimetals , vol.21 , Issue.PART A , pp. 159
    • Kampas, F.J.1
  • 28
    • 0008145623 scopus 로고
    • J.J. Cuomo, S.M. Rossnagel, H.F. Kaufman, eds. (Noyes Publications, Park Ridge, New Jersey)
    • E. Kay and S.M. Rossnagel, (1989). In Handbook of Ion Beam Process Techniques, J.J. Cuomo, S.M. Rossnagel, H.F. Kaufman, eds. (Noyes Publications, Park Ridge, New Jersey), pp. 170-193.
    • (1989) Handbook of Ion Beam Process Techniques , pp. 170-193
    • Kay, E.1    Rossnagel, S.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.