Preparation and basic properties of SrBi2Ta2O9 films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 9 SUPPL. B, 1997, Pages 5896-5899

  Oishi, Yoshihiro ^a   Matsumuro, Yoshinori ^a   Okuyama, Masanori ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Bismuth layered film; DLTS; Ferroelectric; Hysteresis curve; ICP; Laser ablation; MFIS; SrBi2Ta2O9 thin film; XPS; XRD

Indexed keywords

COERCIVE FORCE; CRYSTAL ORIENTATION; HYSTERESIS; LASER ABLATION; PLATINUM; POLARIZATION; PRESSURE EFFECTS; SILICA; STRONTIUM COMPOUNDS; SUBSTRATES; THERMAL EFFECTS; THIN FILMS;

METAL FERROELECTRIC OXIDE SEMICONDUCTOR (MFIS); STRONTIUM BISMUTH TANTALATE;

FERROELECTRIC MATERIALS;

EID: 0031220449     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.5896     Document Type: Article

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