A theoretical investigation of the yield-to-damage enhancement with polyatomic projectiles in organic SIMS

Journal of Physical Chemistry B

Volumn 104, Issue 34, 2000, Pages 8221-8228

  Nguyen, T C ^a   Ward, David W ^a   Townes, Jennifer A ^a   White, Anna K ^a   Krantzinan, Kristin D ^a,b   Garrison, Barbara J ^a  

^a School of Business   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL ORIENTATION; ION BOMBARDMENT; MOLECULAR DYNAMICS; SILICON; SULFUR COMPOUNDS; XENON;

POLYATOMIC PROJECTILES; YIELD TO DAMAGE RATIO; YIELD TO DISAPPEARANCE RATIO;

SECONDARY ION MASS SPECTROMETRY;

EID: 0034246592     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp001089y     Document Type: Article

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