Secondary ion yields produced by keV atomic and polyatomic ion impacts on a self-assembled monolayer surface

Rapid Communications in Mass Spectrometry

Volumn 13, Issue 14, 1999, Pages 1374-1380

  Harris, R D ^a   Baker, W S ^a   Van Stipdonk, M J ^a   Crooks, R M ^a   Schweikert, E A ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ION BOMBARDMENT; IONS; PROJECTILES; SECONDARY EMISSION;

ATOMIC IONS; CLUSTER PROJECTILES; FRAGMENT IONS; IONS IMPACT; MOLECULAR IONS; MONOLAYER SURFACE; POLYATOMIC ION; POLYATOMICS; SECONDARY ION YIELD; SINGLE-ION IMPACTS;

SELF ASSEMBLED MONOLAYERS;

EID: 0032764498     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0231(19990730)13:14<1374::AID-RCM645>3.0.CO;2-5     Document Type: Article

References (61)

1. W. C. Bigelow, D. L. Pickett and W. A. Zisman, J. Colloid. Sci. 1, 513 (1946).
2. E. E. Polymeropoulos and J. Sagiv, J. Chem. Phys. 69, 1836 (1978).
3. J. Sagiv, J. Am. Chem. Soc. 102, 2 (1980).
4. M. D. Porter, T. B. Bright, D. L. Allara and C. E. D. Chidsey, J. Am. Chem. Soc. 109, 3559 (1987).
5. R. G. Nuzzo and D. L. Allara, J. Am. Chem. Soc. 105, 4481 (1983).
6. R. G. Nuzzo, F. A. Fusco and D. L. Allara, J. Am. Chem. Soc. 109, 2358 (1987).
7. H. O. Finklea, S. Avery, M. Lynch and T. Furtsch, Langmuir 3, 409 (1987).
8. E. Sabatani and I. Rubinstein, J. Phys. Chem. 91, 6663 (1987).
9. G. M. Whitesides and P. E. Laibinis, Langmuir 6, 87 (1990).
10. A. Ulman, An Introduction to Ultrathin Organic Films from Langmuir-Blodgett to Self-Assembly, Academic Press, San Diego (1991).
11. L. H. Dubois and R. G. Nuzzo, Annu. Rev. Phys. Chem. 43, 437 (1992).
12. R. G. Nuzzo, L. H. Dubois and D. L. Allara, J. Am. Chem. Soc. 112, 558 (1990).
13. A. Benninghoven, R. G. Rudenauer and H. W. Werner, Secondary Ion Mass Spectrometry-Basic Concepts, Instrumental Aspects, Applications and Trends, John Wiley and Sons, New York (1987).
14. W. N. Delgass and R. G. Cooks, Science 235, 545 (1987).
15. M. J. Tarlov and J. G. Newman, Langmuir 8, 1398 (1992).
16. Y. Li, J. Huang, R. T. McIver, Jr. and J. C. Hemminger, J. Am. Chem. Soc. 114, 2428 (1992).
17. J. Huang and J. C. Hemminger, J. Am. Chem. Soc. 115, 3342 (1993).
18. R. G. Nuzzo, B. R. Zegarski and L. H. Dubois, J. Am. Chem. Soc. 109, 733 (1987).
19. H. O. Finklea, in Electroanalytical Chemistry, Vol. 19, A. J. Bard and I. Rubinstein (Eds), Marcel Dekker, New York, p. 109 (1996).
20. R. M. Crooks and A. J. Ricco, Acc. Chem. Res. 31, 219 (1998).
21. R. M. Crooks, H. C. Yang, L. J. McEllistrem, R. C. Thomas and A. J. Ricco, Faraday Discuss. 107, 285 (1997).
22. N. L. Abbott, J. P. Folkers and G. M. Whitesides, Science 257, 1380 (1992).
23. G. P. Lopez, H. A. Biebuyck, C. D. Firsbie and G. M. Whitesides, Science 260, 647 (1993).
24. A. Kumar, H. A. Biebuyck and G. M. Whitesides, Langmuir 10, 1498 (1994).
25. M. J. Tarlov, D. R. F. Burgess and G. Gillen, J. Am. Chem. Soc. 115, 5305 (1993).
26. G. Gillen, J. Bennett, M. J. Tarlov and D. R. F. Burgess, Anal. Chem. 66, 2170 (1994).
27. A. D. Appelhans, J. E. Delmore and D. A. Dahl, Anal. Chem. 59, 1685 (1987).
28. A. D. Appelhans and J. E. Delmore, Anal. Chem. 61, 1087 (1989).
29. M. G. Blain, S. Della-Negra, H. Joret, Y. Le Beyec and E. A. Schweikert, Phys. Rev. Lett. 63, 1625 (1989).
30. M. G. Blain, S. Della-Negra, H. Joret, Y. Le Beyec and E. A. Schweikert, J. Phys. (Paris), Colloq. 50, C2-147 (1989).
31. E. A. Schweikert, M. G. Blain, M. A. Park and E. F. da Silveira, Nucl. Instrum. Methods B 50, 307 (1990).
32. M. A. Park, E. A. Schweikert, E. F. da Silveira, C. V. Barros Leite and J. M. F. Jeronymo, Nucl. Instrum Methods B 56/57, 361 (1991).
33. M. Benguerba, A. Brunelle, S. Della-Negra, J. Depauw, H. Joret, Y. Le Beyec, M. G. Blain, E. A. Schweikert, G. Ben Assayag and P. Sudraud, Nucl. Instrum. Methods B 62, 8 (1991).
34. J. E. Delmore and A. D. Appelhans, Biol. Mass Spectrom. 20, 237 (1991).
35. M. A. Park, B. D. Cox and E. A. Schweikert, J. Chem. Phys. 96, 8171 (1992).
36. K. Boussofiane-Baudin, G. Bolbach, A. Brunelle, S. Della-Negra, P. Håkansson and Y. Le Beyec, Nucl. Instrum. Methods Phys. Res. B 88, 160 (1994).
37. P. A. Demirev, J. Eriksson, R. A. Zubarev R. Papaleo, G. Brinkmalm, P. Håkansson and B. U. R. Sundqvist, Nucl. Instrum. Methods B 88, 139 (1994).
38. W. Szymczak and K. Wittmaack, Nucl. Instrum. Methods Phys. Res. B 88, 149 (1994).
39. J. C. Ingram, G. S. Groenewold, A. D. Appelhans, J. E. Delmore and D. A. Dahl, Anal. Chem. 67, 187 (1995).
40. M. J. Van Stipdonk, R. D. Harris and E. A. Schweikert, Rapid Comm. Mass Spectrom. 10, 1987 (1996).
41. R. D. Harris, M. J. Van Stipdonk and E. A. Schweikert, Int. J. Mass Spectrom. Ion Processes 174, 167 (1998).
42. F. Kotter, E. Niehuis and A. Benninghoven, in Secondary Ion Mass Spectrometry, SIMS XI, G. Gillen, R. Lareau, J. Bennett and F. Stevie (Eds), John Wiley & Sons, New York, pp. 459-462 (1998).
43. R. D. Harris, C. W. Diehnelt, M. J. Van Stipdonk and E. A. Schweikert, in Secondary Ion Mass Spectrometry, SIMS XI, G. Gillen, R. Lareau, J. Bennett and F. Stevie (Eds), John Wiley and Sons, New York, pp. 463-466 (1998).
44. E. T. Ada and L. Hanley, Int. J. Mass Spectrom. Ion Processes, 174, 231 (1998).
45. D. Stapel, O. Brox and A. Benninhoven, Appl. Surf. Sci. 140, 156 (1999).
46. E. Cooper and G. J. Leggett, Langmuir 14, 4795 (1998).
47. D. A. Hutt, E. Cooper, G. J. Leggett, J. Phys. Chem. B 102, 174 (1998).
48. S. Pan, D. G. Castner and B. D. Ratner, Langmuir 14, 3545 (1998).
49. M.-W. Tsao, C. L. Hoffman, J. F. Rabolt, H. E. Johnson, D. G. Castner, C. Erdelen and H. Ringsdorf, Langmuir 13, 4317 (1997).
50. J. L. Trevor, D. E. Mencer, K. R. Lykke, M. J. Pellin and L. Hanley, Anal. Chem. 69, 4331 (1997).
51. S. Della Negra, D. Jacquet, I. Lorthiois and Y. Le Beyec, J. Mass Spectrom. Ion. Phys. 53, 215 (1983).
52. S. Della Negra and Y. Le Beyec, in Secondary Ion Mass Spectrometry, SIMS VI, edited A. Benninghoven (Ed.), John Wiley and Sons, New York, p. 247 (1988).
53. M. J. Van Stipdonk, E. A. Schweikert and M. A. Park, J. Mass Spectrom. 32, 1151 (1997).
54. A. Benninghoven, Surf. Sci. 35, 427 (1973).
55. R. L. Betts, E. F. da Silveira and E. A. Schweikert, Int. J. Mass Spectrom. Ion Processes 145, 9 (1995).
56. M. J. Van Stipdonk, R. D. Harris and E. A. Schweikert, Rapid Comm. Mass Spectrom. 11, 1794 (1997).
57. J. R. Scott, L. S. Baker, W. R. Everett, C. L. Wilkins and I. Fritsch, Anal. Chem. 69, 2636 (1997).
58. A. Brunelle, P. Chaurand, S. Della-Negra, J. DePauw, Y. Le Beyec and G. B. Baptista, in Proc. 40th ASMS Conf. Mass Spectrometry and Allied Topics, Washington D.C., 31 May-5 June 1992, p. 513.
59. M. H. Shapiro, G. A. Tosheff and T. A. Tombrello, Nucl. Instrum. Methods B 88, 81 (1994).
60. C. W. Diehnelt, M. J. Van Stipdonk and E. A. Schweikert, Nucl. Instrum. Methods B 142, 606 (1998).
61. J. A. Townes, A. K. White, K. D. Krantzman and B. J. Garrison, Proceedings of the Fifteenth International Conference on the Application of Accelerators in Research and Industry, (1998) in press.