Nanofabrication on hydrogen-terminated diamond surfaces by atomic force microscope probe-induced oxidation

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 7 B, 2000, Pages 4631-4632

  Tachiki, Minoru ^a,b   Fukuda, Tohru ^a,b   Sugata, Kenta ^b   Seo, Hokuto ^b   Umezawa, Hitoshi ^a,b   Kawarada, Hiroshi ^a,b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b WASEDA UNIVERSITY   (Japan)

Author keywords

AFM; Diamond; Electron affinity; Hydrogen termination; SPM; Surface conduction

Indexed keywords

ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; ELECTRIC CURRENTS; ELECTRON TUNNELING; HYDROGEN; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE;

ELECTRON AFFINITY; FOWLER-NORDHEIM TUNNELING;

DIAMONDS;

EID: 0034228375     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.4631     Document Type: Article

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