Fabrication and characterization of metal/GaN contacts

Applied Surface Science

Volumn 161, Issue 1, 2000, Pages 263-267

  Pal, Suparna ^a   Sugino, Takashi ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ANNEALING; ELECTRIC RESISTANCE; GOLD; SEMICONDUCTING GALLIUM COMPOUNDS; TITANIUM; X RAY PHOTOELECTRON SPECTROSCOPY;

GALLIUM NITRIDE; SPECIFIC CONTACT RESISTANCE; TRANSFER LENGTH METHOD;

OHMIC CONTACTS;

EID: 0034225984     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00302-0     Document Type: Article

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