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Volumn 39, Issue 7 B, 2000, Pages 4460-4463

High resolution photoemission study of low-temperature oxidation on the Si(001) surface

Author keywords

Adsorbates; Core level shifts; Oxidation; Photoemission; Silicon surfaces; Suboxides

Indexed keywords

ADSORPTION; AGGLOMERATION; ANNEALING; BINDING ENERGY; MONOLAYERS; OPTICAL RESOLVING POWER; OXIDATION; PHOTOEMISSION; STRUCTURAL ANALYSIS; TEMPERATURE CONTROL;

EID: 0034224990     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.4460     Document Type: Article
Times cited : (31)

References (24)
  • 21
    • 33645043589 scopus 로고    scopus 로고
    • unpublished data
    • H. W. Yeom: unpublished data.
    • Yeom, H.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.