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Volumn 39, Issue 7 B, 2000, Pages 4460-4463
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High resolution photoemission study of low-temperature oxidation on the Si(001) surface
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Author keywords
Adsorbates; Core level shifts; Oxidation; Photoemission; Silicon surfaces; Suboxides
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Indexed keywords
ADSORPTION;
AGGLOMERATION;
ANNEALING;
BINDING ENERGY;
MONOLAYERS;
OPTICAL RESOLVING POWER;
OXIDATION;
PHOTOEMISSION;
STRUCTURAL ANALYSIS;
TEMPERATURE CONTROL;
HIGH-RESOLUTION PHOTOEMISSION;
METASTABLE OXYGEN-ADSORBATE COMPLEX;
OXYGEN ADSORPTION;
STRUCTURAL RELAXATION;
SUBMONOLAYER ADSORPTION;
SILICON;
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EID: 0034224990
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.39.4460 Document Type: Article |
Times cited : (31)
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References (24)
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